CV and DLTS Analysis of Materials for Microelectronic Applications

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fulltext.pdf (28.35 MB)
Date
2008-05
Authors
Lohn, Christopher
Journal Title
Journal ISSN
Volume Title
Publisher
Abstract
No abstract prepared.
Description
Keywords
DLTS, Deep level transient spectroscopy
Citation
Lohn, C. (2008). <i>CV and DLTS analysis of materials for microelectronic applications</i> (Unpublished thesis). Texas State University-San Marcos, San Marcos, Texas.
URI
https://hdl.handle.net/10877/4018
Collections
Graduate College Theses and Dissertations