Compositional and Topographical Analysis of Electronic and Magnetic Film Materials using Scanning Electron Microscopy

Date

2000-12

Authors

Matheaus, Michael L.

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Keywords

Scanning electron microscopy, Integrated circuits, Semiconductors, Magnetic films, Microelectronics, X-ray microanalysis

Citation

Matheaus, M. L. (2000). <i>Compositional and topographical analysis of electronic and magnetic film materials using scanning electron microscopy</i> (Unpublished thesis). Southwest Texas State University, San Marcos, Texas.

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