Atomic Force Microscopy and Its Applications

Date

2000-12

Authors

Yamaguchi, Yuji

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Abstract

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Keywords

Atomic force microscopy, Scanning tunneling microscopy, Scanning probe microscopy, Dielectrics

Citation

Yamaguchi, Y. (2000). <i>Atomic force microscopy and its applications</i> (Unpublished thesis). Southwest Texas State University, San Marcos, Texas.

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