Atomic Force Microscopy and Its Applications

Simple item page
dc.contributor.advisorGalloway, Heather C.
dc.contributor.authorYamaguchi, Yuji
dc.contributor.committeeMemberMichalk, Victor E.
dc.contributor.committeeMemberGeerts, Wilhelmus J.
dc.date.accessioned2019-11-20T15:48:39Z
dc.date.available2019-11-20T15:48:39Z
dc.date.issued2000-12
dc.description.abstractNo abstract prepared.
dc.description.departmentPhysics
dc.formatText
dc.format.extent82 pages
dc.format.medium1 file (.pdf)
dc.identifier.citationYamaguchi, Y. (2000). Atomic force microscopy and its applications (Unpublished thesis). Southwest Texas State University, San Marcos, Texas.
dc.identifier.urihttps://hdl.handle.net/10877/8847
dc.language.isoen
dc.subjectatomic force microscopy
dc.subjectscanning tunneling microscopy
dc.subjectscanning probe microscopy
dc.subjectdielectrics
dc.titleAtomic Force Microscopy and Its Applications
dc.typeThesis
thesis.degree.departmentPhysics
thesis.degree.grantorSouthwest Texas State University
thesis.degree.levelMasters
thesis.degree.nameMaster of Science

Files

Original bundle

Now showing 1 - 1 of 1
Thumbnail Image
Name:
Yamaguchi_Yuji_2000.pdf
Size:
4.23 MB
Format:
Adobe Portable Document Format
Download

Collections

Graduate Theses and Dissertations